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5075 series seiko npc corporation ? vcxo module ic with built-in varicap overview the 5075 series are miniature vcxo ics that provide a wide frequency pulling range, even when using minia- ture crystal units for which a wide pulling range is dif?ult to provide. they employ a recently developed vari- cap diode fabrication process that provides a wide frequency pulling range and good linearity without any external components. also, they employ a regulated voltage drive oscillator circuit that signi?antly reduces current consumption, crystal current, and oscillation characteristics supply voltage dependency. the 5075 series are ideal for miniature, wide pulling range, low power consumption, vcxo modules. features vcxo with recently developed varicap diode built-in new fabrication process that signi?antly reduces parasitic capacitance and provides wide pulling range even when using miniature crystal units regulated voltage drive oscillator circuit for reduced power consumption, crystal drive current, and oscillation characteristics voltage dependency wide frequency pulling range 190ppm (b1 version, f = 27mhz) (crystal: = 300, c0 = 1.5pf) operating supply voltage range: 2.25v to 3.63v oscillation frequency range (for fundamental oscil- lation): 20mhz to 55mhz (varies with version) low current consumption: 1.0ma (b1 version, f = 27mhz, no load, v dd = 3.3v) frequency divider built-in selectable by version: f o , f o /2, f o /4, f o /8, f o /16 frequency divider output for 1.3mhz (min) low frequency output vc pin input resistance: 10m ? (min) cmos output two types of pad layout selectable by mounting method ? version: for flip chip bonding ? version: for wire bonding package: wafer form (wf5075 ) chip form (cf5075 ) applications 2.5 2.0mm, 3.2 2.5mm size miniature vcxo modules for digital mobile tv tuner, digital tv (pdp, lcd), pnd (personal navigation device), etc. ordering information device package wf5075 ? 4 wafer form cf5075 ? 4 chip form free datasheet http:///
5075 series seiko npc corporation ? series configuration version name operating supply voltage range [v] pad layout recommended operating frequency range *1 [mhz] *1. the recommended operating frequency is a yardstick value derived from the crystal used for npc characteristics authenticati on. however, the oscil- lation frequency range is not guaranteed. speci?ally, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. output frequency and version name *2 *2. versions in parentheses ( ) are under development. f o output f o /2 output f o /4 output f o /8 output f o /16 output 2.25 to 3.63 flip chip bonding 20 to 40 (5075a1) (5075a2) (5075a3) (5075a4) (5075a5) 40 to 55 (5075aj) (5075ak) (5075al) (5075am) (5075an) wire bonding 20 to 40 5075b1 (5075b2) (5075b3) (5075b4) (5075b5) 40 to 55 5075bj (5075bk) (5075bl) (5075bm) (5075bn) device package version name wf5075 ? wafer form cf5075 ? chip form wf5075 ? 4 form wf: wafer form cf: chip (die) form oscillation frequency range, frequency divider function pad layout type a: for flip chip bonding b: for wire bonding free datasheet http:///
5075 series seiko npc corporation ? pad layout (unit: m) pad dimensions pin description block diagram 5075a (for flip chip bonding) 5075b (for wire bonding) chip size: 0.84 0.69mm chip thickness: 130? ?15? pad size: 90? 90? chip base: v ss level chip size: 0.84 0.69mm chip thickness: 130? ?15? pad size: 90? 90? chip base: v ss level pad no. pad dimensions [m] pad no. pin i/o description x y 5075a 5075b 1 ?89 ?40 1 2 xt i crystal connection pin (ampli?r input) 2 189 ?40 2 1 xtn o crystal connection pin (ampli?r output) 3 315 ?1 3 6 vdd (+) supply pin 4 315 225 4 5 q o clock output pin 5 ?15 225 5 4 vss ( ? ) supply pin 6 ?15 ?1 6 3 vc i oscillation frequency control voltage input pin (positive polarity) (frequency increases with increasing voltage) *1. n = 1, 2, 4, 8, 16 xt xtn vdd q vc vss x y (420, 345) ( ?42 0, ?345 ) 12 3 4 6 5 (0,0) xtn xt vc vss vdd q x y (420, 345) ( ?42 0, ?345 ) 12 3 4 6 5 (0,0) 1 n vss oscillation detector q voltage regulator r vc1 xt vdd xtn vc c vc2 r f r vc2 c vc1 c out r d c in level shifter cmos ouput buffer *1 free datasheet http:///
5075 series seiko npc corporation ? absolute maximum ratings v ss = 0v recommended operating conditions v ss = 0v parameter symbol conditions rating unit supply voltage range v dd between vdd and vss ? 0.5 to 7.0 v input voltage range v in input pins ? 0.5 to v dd + 0.5 v output voltage range v out output pins ? 0.5 to v dd + 0.5 v storage temperature range t stg wafer form, chip form ? 65 to +150 c output current i out q pin 20 ma parameter symbol conditions rating unit min typ max operating supply voltage v dd c lout 15pf 2.25 3.63 v input voltage v in input pins v ss ? dd v operating temperature t opr ?0 +85 c oscillation frequency *1 *1. the oscillation frequency is a yardstick value derived from the crystal used for npc characteristics authentication. howeve r, the oscillation frequency range is not guaranteed. speci?ally, the characteristics can vary greatly due to crystal characteristics and mounting conditio ns, so the oscillation characteristics of components must be carefully evaluated. f o 5075 1 to 5075 5 20?0mhz 5075 j to 5075 n 40?5mhz output frequency f out c lout 15pf 5075 1 to 5075 5 1.25 40 mhz 5075 j to 5075 n 2.5 55 mhz free datasheet http:///
5075 series seiko npc corporation ? electrical characteristics 5075 1 to 5075 5 v dd = 2.25 to 3.63v, v c = 0.5v dd , v ss = 0v, ta = 40 to +85 c unless otherwise noted. parameter symbol conditions rating unit min typ max current consumption i dd 5075 1 (f o ), measurement circuit 1, no load, f o = 27mhz, f out = 27mhz v dd = 2.5v 0.7 1.4 ma v dd = 3.3v 1.0 2.0 ma 5075 2 (f o /2), measurement circuit 1, no load, f o = 27mhz, f out = 13.5mhz v dd = 2.5v 0.6 1.2 ma v dd = 3.3v 0.8 1.6 ma 5075 3 (f o /4), measurement circuit 1, no load, f o = 27mhz, f out = 6.75mhz v dd = 2.5v 0.5 1.0 ma v dd = 3.3v 0.7 1.4 ma 5075 4 (f o /8), measurement circuit 1, no load, f o = 27mhz, f out = 3.38mhz v dd = 2.5v 0.5 1.0 ma v dd = 3.3v 0.6 1.2 ma 5075 5 (f o /16), measurement circuit 1, no load, f o = 27mhz, f out = 1.69mhz v dd = 2.5v 0.4 0.8 ma v dd = 3.3v 0.6 1.2 ma high-level output voltage v oh q pin, measurement circuit 2, i oh = ?.8ma v dd ?0.4 v low-level output voltage v ol q pin, measurement circuit 2, i ol = 2.8ma 0.4 v oscillator block built-in resistance r vc1 measurement circuit 3 210 420 840 k ? r vc2 210 420 840 k ? oscillator block built-in capacitance c vc1 design value (a monitor pattern on a wafer is tested), excluding parasitic capacitance. v c = 0.3v 5.6 pf v c = 1.65v 3.1 pf v c = 3.0v 1.5 pf c vc2 v c = 0.3v 8.4 pf v c = 1.65v 4.7 pf v c = 3.0v 2.3 pf vc input resistance r vin measurement circuit 4, ta = 25 c10m ? vc input impedance z vin measurement circuit 5, v c = 0v, f = 10khz, ta = 25 c (a monitor pattern on a wafer is tested) 450 k ? vc input capacitance c vin measurement circuit 5, v c = 0v, f = 10khz, ta = 25 c (a monitor pattern on a wafer is tested) ?7pf modulation characteristics *1 *1. the modulation characteristics may vary with the crystal used. fm measurement circuit 6, ?db frequency, v dd = 3.3v, v c = 3.3vp-p, ta = 25 c, f o = 27mhz ?5khz free datasheet http:///
5075 series seiko npc corporation ? 5075 j to 5075 n v dd = 2.25 to 3.63v, v c = 0.5v dd , v ss = 0v, ta = 40 to +85 c unless otherwise noted. parameter symbol conditions rating unit min typ max current consumption i dd 5075 j (f o ), measurement circuit 1, no load, f o = 48mhz, f out = 48mhz v dd = 2.5v 1.2 2.4 ma v dd = 3.3v 1.6 3.2 ma 5075 k (f o /2), measurement circuit 1, no load, f o = 48mhz, f out = 24mhz v dd = 2.5v 0.9 1.8 ma v dd = 3.3v 1.3 2.6 ma 5075 l (f o /4), measurement circuit 1, no load, f o = 48mhz, f out = 12mhz v dd = 2.5v 0.8 1.6 ma v dd = 3.3v 1.0 2.0 ma 5075 m (f o /8), measurement circuit 1, no load, f o = 48mhz, f out = 6mhz v dd = 2.5v 0.7 1.4 ma v dd = 3.3v 0.9 1.8 ma 5075 n (f o /16), measurement circuit 1, no load, f o = 48mhz, f out = 3mhz v dd = 2.5v 0.7 1.4 ma v dd = 3.3v 0.9 1.8 ma high-level output voltage v oh q pin, measurement circuit 2, i oh = ?.8ma v dd ?0.4 v low-level output voltage v ol q pin, measurement circuit 2, i ol = 2.8ma 0.4 v oscillator block built-in resistance r vc1 measurement circuit 3 210 420 840 k ? r vc2 210 420 840 k ? oscillator block built-in capacitance c vc1 design value (a monitor pattern on a wafer is tested), excluding parasitic capacitance. v c = 0.3v 5.6 pf v c = 1.65v 3.1 pf v c = 3.0v 1.5 pf c vc2 v c = 0.3v 8.4 pf v c = 1.65v 4.7 pf v c = 3.0v 2.3 pf vc input resistance r vin measurement circuit 4, ta = 25 c10m ? vc input impedance z vin measurement circuit 5, v c = 0v, f = 10khz, ta = 25 c (a monitor pattern on a wafer is tested) 450 k ? vc input capacitance c vin measurement circuit 5, v c = 0v, f = 10khz, ta = 25 c (a monitor pattern on a wafer is tested) ?7pf modulation characteristics *1 *1. the modulation characteristics may vary with the crystal used. fm measurement circuit 6, ?db frequency, v dd = 3.3v, v c = 3.3vp-p, ta = 25 c, f o = 48mhz ?3khz free datasheet http:///
5075 series seiko npc corporation ? switching characteristics v dd = 2.25 to 3.63v, v c = 0.5v dd , v ss = 0v, ta = 40 to +85 c unless otherwise noted. switching time measurement waveform parameter symbol conditions rating unit min typ max output rise time t r measurement circuit 7, 0.2v dd 0.8v dd , c lout = 15pf 2.1 4.0 ns output fall time t f measurement circuit 7, 0.8v dd 0.2v dd , c lout = 15pf 2.1 4.0 ns output duty cycle duty measurement circuit 7, ta = 25 c, c lout = 15pf, v dd = 3.3v 45 50 55 % 0.8v dd q duty measurement voltage (0.5v dd ) t w t r t f t 0.2v dd 0.8v dd 0.2v dd duty= t w / t 100 (%) free datasheet http:///
5075 series seiko npc corporation ? measurement circuits measurement circuit 1 measurement parameter: i dd measurement circuit 2 measurement parameter: v oh , v ol measurement circuit 3 measurement parameter: r vc1 , r vc2 measurement circuit 4 measurement parameter: r vin measurement circuit 5 measurement parameter: c vin , z vin measurement circuit 6 measurement parameter: fm measurement circuit 7 measurement parameter: duty, t r , t f xt input signal: 1vp-p, sine wave vdd vss xt q crystal xtn a vc 0.1 f i dd signal generator 50 ? 0.001 f v oh v ol v 50 ? 0.1 fv s ? v v oh v s ? v v ol v s 0.1 f vdd vss xt q xtn vc v s adjusted such that ? v = 50 i oh . v s adjusted such that ? v = 50 i ol . vdd vss a vc i xt xt xtn r vc 1 = v dd i xt vdd vss a vc i xtn xt xtn r vc 2 = v dd i xtn vc input signal: 100hz to 10khz, 0.1vp-p c1 = 33?, r1 = r2 = 1m ? vc modulation signal: 100hz to 100khz, 0 to v dd p-p vdd vss a vc i vin xt xtn r vin = v dd i vin vdd vss xt q xtn vc impedance analyzer (hp 4194a) r1 c1 c lout = 15pf 0.1 f vdd vss xt q xtn vc gain-phase analyzer (hp 4194a) modulaiton analyzer (hp 8901b) crystal r2 demodulation signal modulation signal vdd vss xt q crystal xtn vc 0.1 f c lout = 15pf (including probe capacitance) free datasheet http:///
5075 series seiko npc corporation ? functional description oscillation start-up detector function the devices also feature an oscillation start-up detector circuit. this circuit functions to disable the outputs until the oscillation starts. this prevents unstable oscillator output at oscillator start-up when power is applied. typical performance (5075b1) the following characteristics measured using the crystal below. note that the characteristics will vary with the crystal used. crystal used for measurement crystal parameters frequency pulling range pulling sensitivity measurement circuit parameter f o = 27mhz c0 [pf] 1.5 (= c0/c1) 300 l1 c0 r1 c1 v dd = 2.5v, f out = 27mhz, ta = r.t. 0 50 ? 50 ? 100 ? 150 ? 200 ? 250 100 150 200 250 0.00 0.25 0.50 v c [v] pulling range [ppm] 0.75 1.00 1.25 1.50 1.75 2.00 2.25 2.50 v dd = 3.3v, f out = 27mhz, ta = r.t. 0 50 ? 50 ? 100 ? 150 ? 200 ? 250 100 150 200 250 pulling range [ppm] 0.00 0.30 0.60 v c [v] 0.90 1.20 1.50 1.80 1.65 2.10 2.40 2.70 3.30 3.00 v dd = 2.5v, 3.3v, f out = 27mhz, ta = r.t. 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 0 50 100 150 200 250 sensitivity [ppm/v] v c [v] v dd = 2.5v v dd = 3.3v vdd vss xt q crystal xtn vc 0.1 f c lout = 15pf (including probe capacitance) free datasheet http:///
5075 series seiko npc corporation ?0 current consumption measurement circuit frequency stability by supply voltage change measurement circuit f out = 27mhz, ta = r.t. v dd [v] i dd [ma] 3.0 3.3 2.8 2.5 3.6 0 1 2 3 4 5 c lout = 15pf c lout = no load v c = 0v v c = 0.5v dd v c = v dd v c = 0v v c = 0.5v dd v c = v dd vdd vss xt q crystal xtn a vc 0.1 f i dd f out = 27mhz, 0ppm at v dd = 2.5v v dd [v] 3.0 2.5 2.0 3.5 4.0 ? 3.0 ? 2.0 ? 1.0 0.0 1.0 2.0 3.0 ? f/f [ppm] v c = 0v v c = 2.5v v c = 1.25v f out = 27mhz, 0ppm at v dd = 3.3v v dd [v] 3.0 2.5 2.0 3.5 4.0 ? 3.0 ? 2.0 ? 1.0 0.0 1.0 2.0 3.0 ? f/f [ppm] v c = 3.3v v c = 0v v c = 1.65v vdd vss xt q crystal xtn vc 0.1 f c lout = 15pf (including probe capacitance) free datasheet http:///
5075 series seiko npc corporation ?1 drive level measurement circuit negative resistance measurement circuit note. "c0" value is set, concerning the actual crystal characteristics connected between xt and xtn. the data is measured with agilent 4396b using npcs original measurement jig. the values may vary with measurement jig and conditions. v dd = 2.5v, 3.3v, f out = 27mhz, ta = r.t. 0 5 10 15 20 25 30 drive level [ w] 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 v c [v] v dd = 2.5v v dd = 3.3v dl = (i x?al ) 2 re dl: drive level i x?al : current ?wing to crystal (rms value) re: crystal effective resistance vdd vss xt q crystal xtn vc 0.1 f c lout = 15pf tektronix ct-6 current probe i x'tal v dd = 2.5v, c0 = 2pf, ta = r.t. frequency [mhz] 15 20 25 30 35 40 45 v c = 1.25v v c = 2.5v v c = 0v ? 200 ? 400 ? 600 ? 800 0 negative resistance [ ? ] v dd = 3.3v, c0 = 2pf, ta = r.t. frequency [mhz] 15 20 25 30 35 40 45 ? 200 ? 400 ? 600 ? 800 0 negative resistance [ ? ] v c = 1.65v v c = 3.3v v c = 0v vdd vss xt q xtn vc 0.1 f c0 = 2pf network analyzer (agilent 4396b) s-parameter test set (agilent 85046a) free datasheet http:///
5075 series seiko npc corporation ?2 phase noise measurement circuit v dd = 2.5v, f out = 27mhz, ta = r.t. offset frequency [hz] 10 100 1,000 10,000 100,000 1,000,000 10,000,000 phase noise [dbc/hz] ? 60 ? 80 ? 100 ? 120 ? 140 ? 160 v c = 2.5v v c = 1.25v v c = 0v v dd = 3.3v, f out = 27mhz, ta = r.t. offset frequency [hz] 10 100 1,000 10,000 100,000 1,000,000 10,000,000 phase noise [dbc/hz] ? 60 ? 80 ? 100 ? 120 ? 140 ? 160 v c = 3.3v v c = 1.65v v c = 0v c lout = 15pf 0.1 f vdd vss xt q xtn vc signal source analyzer (agilent e5052a) crystal 0.01 f 200 ? free datasheet http:///
5075 series seiko npc corporation ?3 modulation characteristics measurement circuit output waveform measurement equipment: oscilloscope; dso80604b (agilent) measurement circuit v dd = 2.5v, f out = 27mhz, ta = r.t. frequency [khz] 10 100 1000 1 0 fm [db] ? 3 ? 6 ? 9 ? 12 0 3 v dd = 3.3v, f out = 27mhz, ta = r.t. frequency [khz] 10 100 1000 1 0 fm [db] ? 3 ? 6 ? 9 ? 12 0 3 c1 = 33?, r1 = r2 = 1m ? vc modulation signal: 100hz to 100khz, 0 to v dd p-p r1 c1 c lout = 15pf 0.1 f vdd vss xt q xtn vc gain-phase analyzer (hp 4194a) modulaiton analyzer (hp 8901b) crystal r2 demodulation signal modulation signal v dd = 2.5v, 3.3v, f out = 27mhz, v c = 0.5v dd , c lout = 15pf, ta = r.t. v dd = 2.5v v dd = 3.3v vdd vss xt q crystal xtn vc 0.1 f c lout = 15pf (including probe capacitance) free datasheet http:///
5075 series seiko npc corporation ?4 nc0810ae 2009.02 please pay your attention to the following points at time of using the products shown in this document. the products shown in this document (hereinafter ?roducts? are not intended to be used for the apparatus that exerts harmful in?ence on human lives due to the defects, failure or malfunction of the products. customers are requested to obtain prior written agreeme nt for such use from seiko npc corporation (hereinafter ?pc?. customers shall be solely responsible for, and indemnify and hold npc free and harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. npc reserves the right to change the speci?ations of the products in order to improve the characteristic or reliability thereof. npc makes no claim o r warranty that the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties. therefore, npc shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in t his document. any descriptions including applications, circuits, and the parameters of the products in this document are for reference to use the products, and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further te sting or modi?ation. customers are requested not to export or re-export, directly or indirectly, the products to any country or any ent ity not in compliance with or in violation of the national export administration laws, treaties, orders and regulations. customers are req uested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. seiko npc corporation 15-6, nihombashi-kabutocho, chuo-ku, tokyo 103-0026, japan telephone: +81-3-6667-6601 facsimile: +81-3-6667-6611 http://www.npc.co.jp/ email: sales @ npc.co.jp free datasheet http:///

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